Testing capability indices for one-sided processes with measurement errors
In the manufacturing industry, many product characteristics are of one-sided tolerances. The process capability indices Cpu (u, v) and Cpl (u, v) can be used to measure process performance. Most research work related to capability indices assumes no gauge measurement errors. Th...
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| Format: | Article |
| Language: | English |
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EDP Sciences
2013-01-01
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| Series: | International Journal of Metrology and Quality Engineering |
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| Online Access: | https://www.metrology-journal.org/articles/ijmqe/pdf/2013/02/ijmqe130049.pdf |