Structural and optical properties of Zn1−xNixTe thin films prepared by electron beam evaporation technique
Zn1−xNixTe thin films with different composition (x=0.0, 0.05, 0.10, 0.15 and 0.20) were deposited on glass substrate by electron beam evaporation technique followed by its characterization using advanced structural and optical analysis techniques. Structural properties of the prepared thin films we...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2015-02-01
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| Series: | Progress in Natural Science: Materials International |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S100200711500009X |