Stress topology within silicon single-crystal cantilever beam
Flexural elastic deformations of single-crystal silicon have been studied using microspectral Raman scattering. Results are reported on nano-scaled sign-changing shifts of the main peak of the microspectral Raman scattering within the single-crystal silicon cantilever beam during exposure to flexura...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Pensoft Publishers
2015-06-01
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| Series: | Modern Electronic Materials |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2452177915000031 |