Effect of impurity source locations on up-down asymmetry in impurity distributions in the ergodic layer of large helical device
A space-resolved spectroscopy using a 3m normal incidence vacuum ultraviolet (VUV) spectrometer was developed to measure the VUV emission profiles in wavelength range of 300–3200Å from impurities in the edge plasmas in Large Helical Device (LHD). The edge plasma of the LHD is characterized by stocha...
| Main Authors: | , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2017-08-01
|
| Series: | Nuclear Materials and Energy |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352179116302484 |