Exploiting CMOS Manufacturing to Reduce Tuning Requirements for Resonant Optical Devices

We present manufacturing tolerances of cascaded silicon microring resonators fabricated in a commercial 130-nm complementary-oxide semiconductor (CMOS) foundry using 193-nm lithography and provide statistics gathered from over 500 four-channel microring arrays over multiple wafers and fabrication lo...

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Bibliographic Details
Main Authors: Ashok V. Krishnamoorthy, Xuezhe Zheng, Guoliang Li, Jin Yao, Thierry Pinguet, Attila Mekis, Hiren Thacker, Ivan Shubin, Ying Luo, Kannan Raj, John E. Cunningham
Format: Article
Language:English
Published: IEEE 2011-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/6058715/