Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for materi...

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Bibliographic Details
Main Authors: Guangni Zhou, Jiawei Kou, Yao Li, Wenxin Zhu, Kai Chen, Nobumichi Tamura
Format: Article
Language:English
Published: MDPI AG 2018-06-01
Series:Quantum Beam Science
Subjects:
Laue diffraction
microdiffraction
synchrotron
strain/stress measurements
microstructure imaging
nickel-based superalloys
Online Access:http://www.mdpi.com/2412-382X/2/2/13

Internet

http://www.mdpi.com/2412-382X/2/2/13

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