Microchip Health Monitoring System Using the FLL Circuit

Here a solution for a Microchip Health Monitoring (MHM) system using MTOL (Multi-Temperature Operational Life) reliability testing assessment data is proposed. The module monitors frequency degradation over time compared to lab tested data. Since trends in performance degradation in recently develop...

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Bibliographic Details
Main Authors: Emmanuel Bender, Joseph B. Bernstein
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Sensors
Subjects:
BTI
Online Access:https://www.mdpi.com/1424-8220/21/7/2285