Capability for Fine Tuning of the Refractive Index Sensing Properties of Long-Period Gratings by Atomic Layer Deposited Al2O3 Overlays

Capability for Fine Tuning of the Refractive Index Sensing Properties of Long-Period Gratings by Atomic Layer Deposited Al2O3 Overlays

This work presents an application of thin aluminum oxide (Al2O3) films obtained using atomic layer deposition (ALD) for fine tuning the spectral response and refractive-index (RI) sensitivity of long-period gratings (LPGs) induced in optical fibers. The technique allows for an efficient and well con...

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Bibliographic Details
Main Authors: Mateusz Śmietana, Marcin Myśliwiec, Predrag Mikulic, Bartłomiej S. Witkowski, Wojtek J. Bock
Format: Article
Language:English
Published: MDPI AG 2013-11-01
Series:Sensors
Subjects:
optical fiber sensors
refractive index sensor
long-period gratings (LPG)
Atomic Layer Deposition (ALD)
thin films
optical properties
aluminum oxide (Al2O3)
Online Access:http://www.mdpi.com/1424-8220/13/12/16372

Internet

http://www.mdpi.com/1424-8220/13/12/16372

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