Photosensitivity of MESFETs on Epitaxy Layers of GaAs with Monocrystalline Silicon Wafer

<p class="ArticleAnnotation">Researched essentials and physical mechanisms which determine photosensitivity of MESFET on epitaxy layers of GaAs with monocrystalline silicon wafer under their illumination in impure zone absorption spectrum. Conducted experiments showed that source cur...

Full description

Bibliographic Details
Main Authors: S. Novosyadly, V. Gryga, A. Pavlyshyn, V. Lukovkin
Format: Article
Language:English
Published: Vasyl Stefanyk Precarpathian National University 2020-01-01
Series:Фізика і хімія твердого тіла
Subjects:
Online Access:http://journals.pu.if.ua/index.php/pcss/article/view/3956