Multiple-interface tracking of degradation process in organic photovoltaics
The investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2013-10-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4826586 |