Multiple-interface tracking of degradation process in organic photovoltaics

Multiple-interface tracking of degradation process in organic photovoltaics

The investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance...

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Main Authors: Cindy X. Zhao, Lucy L. Deng, Matthew Y. Ma, Joseph R. Kish, Gu Xu
Format: Article
Language:English
Published: AIP Publishing LLC 2013-10-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4826586
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spelling doaj-6e517c6b40424a15901caf2de87ba20f2020-11-25T00:54:30ZengAIP Publishing LLCAIP Advances2158-32262013-10-01310102121102121-710.1063/1.4826586024310ADVMultiple-interface tracking of degradation process in organic photovoltaicsCindy X. Zhao0Lucy L. Deng1Matthew Y. Ma2Joseph R. Kish3Gu Xu4Materials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaThe investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance spectroscopy is employed here, to track multi-interface degradation without breaking the device. By varying DC bias, individual interface degradation is revealed via current density and capacitance versus voltage plots. While one of the impedance semicircles is linked to the interface of P3HT:PCBM, the other represented the interface between the mixture and metal electrode, involving metal oxide in an aged device. The results confirm that, more than one degradation process take place simultaneously at individual interfaces.http://dx.doi.org/10.1063/1.4826586
collection DOAJ
language English
format Article
sources DOAJ
author Cindy X. Zhao
Lucy L. Deng
Matthew Y. Ma
Joseph R. Kish
Gu Xu
spellingShingle Cindy X. Zhao
Lucy L. Deng
Matthew Y. Ma
Joseph R. Kish
Gu Xu
Multiple-interface tracking of degradation process in organic photovoltaics
AIP Advances
author_facet Cindy X. Zhao
Lucy L. Deng
Matthew Y. Ma
Joseph R. Kish
Gu Xu
author_sort Cindy X. Zhao
title Multiple-interface tracking of degradation process in organic photovoltaics
title_short Multiple-interface tracking of degradation process in organic photovoltaics
title_full Multiple-interface tracking of degradation process in organic photovoltaics
title_fullStr Multiple-interface tracking of degradation process in organic photovoltaics
title_full_unstemmed Multiple-interface tracking of degradation process in organic photovoltaics
title_sort multiple-interface tracking of degradation process in organic photovoltaics
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2013-10-01
description The investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance spectroscopy is employed here, to track multi-interface degradation without breaking the device. By varying DC bias, individual interface degradation is revealed via current density and capacitance versus voltage plots. While one of the impedance semicircles is linked to the interface of P3HT:PCBM, the other represented the interface between the mixture and metal electrode, involving metal oxide in an aged device. The results confirm that, more than one degradation process take place simultaneously at individual interfaces.
url http://dx.doi.org/10.1063/1.4826586
work_keys_str_mv AT cindyxzhao multipleinterfacetrackingofdegradationprocessinorganicphotovoltaics
AT lucyldeng multipleinterfacetrackingofdegradationprocessinorganicphotovoltaics
AT matthewyma multipleinterfacetrackingofdegradationprocessinorganicphotovoltaics
AT josephrkish multipleinterfacetrackingofdegradationprocessinorganicphotovoltaics
AT guxu multipleinterfacetrackingofdegradationprocessinorganicphotovoltaics
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