Failure modes analysis of electrofluidic display under thermal ageing

Dielectric failure as well as optical switching failure in electrofluidic display (EFD) are still a bottleneck for sufficient device lifetime. In this study, a dielectric redundancy-designed multilayer insulator of ParyleneC/AF1600X was applied in an EFD device. The reliability performance was syste...

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Bibliographic Details
Main Authors: Baoqin Dong, Biao Tang, Jan Groenewold, Hui Li, Rui Zhou, Alexander Victor Henzen, Guofu Zhou
Format: Article
Language:English
Published: The Royal Society 2018-01-01
Series:Royal Society Open Science
Subjects:
Online Access:https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.181121