Auto-regressive moving average parameter estimation for 1/f process under colored Gaussian noise background
Current algorithms for estimating auto-regressive moving average parameters of transistor 1/f process are usually under noiseless background. Transistor noises are measured by a non-destructive cross-spectrum measurement technique, with transistor noise first passing through dual-channel ultra-low n...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SAGE Publishing
2019-08-01
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| Series: | Journal of Algorithms & Computational Technology |
| Online Access: | https://doi.org/10.1177/1748302619867439 |