Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density dz at the...

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Bibliographic Details
Main Authors: Jannis Lübbe, Matthias Temmen, Sebastian Rode, Philipp Rahe, Angelika Kühnle, Michael Reichling
Format: Article
Language:English
Published: Beilstein-Institut 2013-01-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Cantilever
feedback loop
filter
noncontact atomic force microscopy (NC-AFM)
noise
Online Access:https://doi.org/10.3762/bjnano.4.4

Internet

https://doi.org/10.3762/bjnano.4.4

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