Transient Thermal Analysis of MCM towards Understanding Failure Mechanism of Intermittent Faults
Temperature fluctuation which can be treated as fault event has been recognized as a major cause of the intermittent faults (IFs). In order to investigate the failure mechanism of IFs correlated with temperature, the regulation of IF evolution through fault and reset events is studied and transient...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIDIC Servizi S.r.l.
2013-07-01
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| Series: | Chemical Engineering Transactions |
| Online Access: | https://www.cetjournal.it/index.php/cet/article/view/6306 |