Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy

Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy

An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its n...

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Bibliographic Details
Main Authors: David M. Harcombe, Michael G. Ruppert, Michael R. P. Ragazzon, Andrew J. Fleming
Format: Article
Language:English
Published: Beilstein-Institut 2018-02-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy (AFM)
demodulation
digital signal processing
field-programmable gate array (FPGA)
high-speed
Lyapunov filter
multifrequency
Online Access:https://doi.org/10.3762/bjnano.9.47

Internet

https://doi.org/10.3762/bjnano.9.47

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