Phenomenological models for the isothermal physical aging of PEEK
Creep test is a useful tool to study thermal aging and deformation mechanisms of semi-crystalline polymers, such as polyether-ether-ketone (PEEK). Hou and Chen proposed a power law to fit creep data of PEEK aged at different temperatures and the master curve built from those data. This paper attempt...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2018-12-01
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Series: | Heliyon |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2405844018338945 |