Phenomenological models for the isothermal physical aging of PEEK

Creep test is a useful tool to study thermal aging and deformation mechanisms of semi-crystalline polymers, such as polyether-ether-ketone (PEEK). Hou and Chen proposed a power law to fit creep data of PEEK aged at different temperatures and the master curve built from those data. This paper attempt...

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Bibliographic Details
Main Authors: Élida Beatriz Hermida, Claudio Daniel Arenas
Format: Article
Language:English
Published: Elsevier 2018-12-01
Series:Heliyon
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2405844018338945