High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances
The high voltage temperature humidity bias test (HV-THB) has become increasingly popular for evaluating the performances of power semiconductor devices. Given the new challenges of the power semiconductor industry, several applications and devices need to be designed to withstand harsh environments...
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-11-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/9/11/1884 |