Effect of annealing temperature on microstructure and mechanical properties of a high Al-low Si TRIP steel
By using optical microscope (OM), scanning electron microscope (SEM), transmission electron microscope (TEM), X-ray diffraction (XRD), electron back scattered diffraction (EBSD) and tensile test, the effect of annealing temperature on microstructure and mechanical properties of a high Al-low Si TRIP...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2015-01-01
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| Series: | MATEC Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/matecconf/20152108006 |