Dielectric Relaxation of Lanthanide-Based Ternary Oxides: Physical and Mathematical Models

Cerium-doped hafnium oxides (CexHf1−xO2) and lanthanum-doped zirconium oxides (LaxZr1−xO2) were investigated. The highest dielectric constants, k, were obtained from lightly doped oxides with an La content of x=0.09 and a Ce content of x=0.1, for which k-values of 33~40 were obtained. The dielectric...

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Bibliographic Details
Main Authors: Chun Zhao, C. Z. Zhao, Jing Tao, M. Werner, S. Taylor, P. R. Chalker
Format: Article
Language:English
Published: Hindawi Limited 2012-01-01
Series:Journal of Nanomaterials
Online Access:http://dx.doi.org/10.1155/2012/241470