Extremely Low Frequency-Magnetic Field (ELF-MF) Exposure Characteristics among Semiconductor Workers

Extremely Low Frequency-Magnetic Field (ELF-MF) Exposure Characteristics among Semiconductor Workers

We assessed the exposure of semiconductor workers to extremely low frequency-magnetic fields (ELF-MF) and identified job characteristics affecting ELF-MF exposure. These were demonstrated by assessing the exposure of 117 workers involved in wafer fabrication (fab) and chip packaging wearing personal...

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Bibliographic Details
Main Authors: Sangjun Choi, Wonseok Cha, Jihoon Park, Seungwon Kim, Won Kim, Chungsik Yoon, Ju-Hyun Park, Kwonchul Ha, Donguk Park
Format: Article
Language:English
Published: MDPI AG 2018-03-01
Series:International Journal of Environmental Research and Public Health
Subjects:
extremely low frequency-magnetic fields (ELF-MF)
fabrication (fab) and chip packaging assembly
semiconductors
Online Access:http://www.mdpi.com/1660-4601/15/4/642

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http://www.mdpi.com/1660-4601/15/4/642

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