Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
Up to now, analyzing the production of dislocation-type defects in the subsurface region of plasma or ion-exposed tungsten samples has been hampered by the challenging production of suitable cross-section samples for transmission electron microscopy. We present two reliable methods based on precisio...
Main Authors: | , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2017-08-01
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Series: | Nuclear Materials and Energy |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2352179116300369 |