Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten

Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten

Up to now, analyzing the production of dislocation-type defects in the subsurface region of plasma or ion-exposed tungsten samples has been hampered by the challenging production of suitable cross-section samples for transmission electron microscopy. We present two reliable methods based on precisio...

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Main Authors: A. Manhard, U. von Toussaint, M. Balden, S. Elgeti, T. Schwarz-Selinger, L. Gao, S. Kapser, T. Płociński, J. Grzonka, M. Gloc, Ł. Ciupiński
Format: Article
Language:English
Published: Elsevier 2017-08-01
Series:Nuclear Materials and Energy
Online Access:http://www.sciencedirect.com/science/article/pii/S2352179116300369
id doaj-757468a6d0604ee89e2e62a35a6f6d7e
record_format Article
spelling doaj-757468a6d0604ee89e2e62a35a6f6d7e2020-11-25T00:28:48ZengElsevierNuclear Materials and Energy2352-17912017-08-0112714719Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungstenA. Manhard0U. von Toussaint1M. Balden2S. Elgeti3T. Schwarz-Selinger4L. Gao5S. Kapser6T. Płociński7J. Grzonka8M. Gloc9Ł. Ciupiński10Max Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, Germany; Corresponding author.Max Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, GermanyMax Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, GermanyMax Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, GermanyMax Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, GermanyMax Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, GermanyMax Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, Germany; Physik-Department, Technische Universität München, James-Franck-Str. 1, 85748 Garching, GermanyWarsaw University of Technology, Faculty of Materials Science and Engineering, Materials Design Division, Wołoska 141, 02-524 Warsaw, PolandWarsaw University of Technology, Faculty of Materials Science and Engineering, Materials Design Division, Wołoska 141, 02-524 Warsaw, Poland; Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, PolandWarsaw University of Technology, Faculty of Materials Science and Engineering, Materials Design Division, Wołoska 141, 02-524 Warsaw, PolandWarsaw University of Technology, Faculty of Materials Science and Engineering, Materials Design Division, Wołoska 141, 02-524 Warsaw, PolandUp to now, analyzing the production of dislocation-type defects in the subsurface region of plasma or ion-exposed tungsten samples has been hampered by the challenging production of suitable cross-section samples for transmission electron microscopy. We present two reliable methods based on precision electropolishing to prepare cross-sections of tungsten that allow direct imaging of dislocation-type defects by scanning as well as by transmission electron microscopy. Using these methods, we are able to demonstrate a clear enhancement of the dislocation density in the caps of blisters on tungsten exposed to H isotope plasma, i.e., of surface morphologies that are correlated to subsurface cavities. As a benchmark, we also show a cross-section of tungsten irradiated by 20 MeV W6+ ions. Keywords: Tungsten, Plasma, Blistering, Cross-section, Electropolishing, Dislocationshttp://www.sciencedirect.com/science/article/pii/S2352179116300369
collection DOAJ
language English
format Article
sources DOAJ
author A. Manhard
U. von Toussaint
M. Balden
S. Elgeti
T. Schwarz-Selinger
L. Gao
S. Kapser
T. Płociński
J. Grzonka
M. Gloc
Ł. Ciupiński
spellingShingle A. Manhard
U. von Toussaint
M. Balden
S. Elgeti
T. Schwarz-Selinger
L. Gao
S. Kapser
T. Płociński
J. Grzonka
M. Gloc
Ł. Ciupiński
Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
Nuclear Materials and Energy
author_facet A. Manhard
U. von Toussaint
M. Balden
S. Elgeti
T. Schwarz-Selinger
L. Gao
S. Kapser
T. Płociński
J. Grzonka
M. Gloc
Ł. Ciupiński
author_sort A. Manhard
title Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
title_short Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
title_full Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
title_fullStr Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
title_full_unstemmed Microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
title_sort microstructure and defect analysis in the vicinity of blisters in polycrystalline tungsten
publisher Elsevier
series Nuclear Materials and Energy
issn 2352-1791
publishDate 2017-08-01
description Up to now, analyzing the production of dislocation-type defects in the subsurface region of plasma or ion-exposed tungsten samples has been hampered by the challenging production of suitable cross-section samples for transmission electron microscopy. We present two reliable methods based on precision electropolishing to prepare cross-sections of tungsten that allow direct imaging of dislocation-type defects by scanning as well as by transmission electron microscopy. Using these methods, we are able to demonstrate a clear enhancement of the dislocation density in the caps of blisters on tungsten exposed to H isotope plasma, i.e., of surface morphologies that are correlated to subsurface cavities. As a benchmark, we also show a cross-section of tungsten irradiated by 20 MeV W6+ ions. Keywords: Tungsten, Plasma, Blistering, Cross-section, Electropolishing, Dislocations
url http://www.sciencedirect.com/science/article/pii/S2352179116300369
work_keys_str_mv AT amanhard microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT uvontoussaint microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT mbalden microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT selgeti microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT tschwarzselinger microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT lgao microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT skapser microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT tpłocinski microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT jgrzonka microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT mgloc microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
AT łciupinski microstructureanddefectanalysisinthevicinityofblistersinpolycrystallinetungsten
_version_ 1725334422926917632

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