Development of an Apparatus for Measuring Adhesive Force between Fine Particles [Translated]†

We developed an apparatus that uses the direct separation method to measure adhesive force between fine particles, and between a fine particle and a flat-surface substrate. This apparatus was able to measure adhesive force with high resolution...

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Bibliographic Details
Main Authors: Yasuhiro shimada, Yorinobu Yonezawa, Hisakazu Sunada, Ryusei Nonaka, Kenzou Katou, Hiroshi Morishita
Format: Article
Language:English
Published: Hosokawa Powder Technology Foundation 2014-03-01
Series:KONA Powder and Particle Journal
Subjects:
Online Access:https://www.jstage.jst.go.jp/article/kona/20/0/20_2002024/_pdf/-char/en