Novel failure mechanism of nanoscale mesa‐type avalanche photodiodes under harsh environmental stresses
Abstract Avalanche photodiode (APD) is an indispensable receiver component because of its high bandwidth and low noise performance. Recently, APD reliability, under harsh environmental stresses such as high heat and humidity, has drawn great interest in the applications of passive optical network, w...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2021-03-01
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| Series: | IET Nanodielectrics |
| Online Access: | https://doi.org/10.1049/nde2.12001 |