VASTA: A Wide Voltage Statistical Timing Analysis Tool Based on Variation-Aware Cell Delay Models
In the advanced technology nodes, process parameter variations are increasingly resulting in unpredictable device behavior. The issue is even aggravated by low power requirements which stretches the transistor operation into near-threshold regime. Despite device simulation gives precise results, it...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9246596/ |