Beam profile measurement of ES-200 using secondary electron emission monitor
Up to now, different designs have been introduced for measurement beam profile accelerators. Secondary electron emission monitors (SEM) are one of these devices which have been used for this purpose. In this work, a SEM has been constructed to measure beam profile of ES-200 accelerator, a proton ele...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Isfahan University of Technology
2015-09-01
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| Series: | Iranian Journal of Physics Research |
| Subjects: | |
| Online Access: | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-722&slc_lang=en&sid=1 |