Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method
The reconvergence-phenomenon is common in modern circuit design. It occurs when the signal reconvenes at a certain point through multiple sensitized paths. It affects the soft error estimation and hardening. It is complicated to analyze the reconvergence-phenomenon accurately. In this paper, we prop...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8449929/ |