High-density genetic mapping of a major QTL for resistance to multiple races of loose smut in a tetraploid wheat cross.

High-density genetic mapping of a major QTL for resistance to multiple races of loose smut in a tetraploid wheat cross.

Loose smut, caused by Ustilago tritici (Pers.) Rostr., is a systemic disease of tetraploid durum wheat (Triticum turgidum L.). Loose smut can be economically controlled by growing resistant varieties, making it important to find and deploy new sources of resistance. Blackbird, a variety of T. turgid...

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Bibliographic Details
Main Authors: Sachin Kumar, Ron E Knox, Asheesh K Singh, Ron M DePauw, Heather L Campbell, Julio Isidro-Sanchez, Fran R Clarke, Curtis J Pozniak, Amidou N'Daye, Brad Meyer, Andrew Sharpe, Yuefeng Ruan, Richard D Cuthbert, Daryl Somers, George Fedak
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2018-01-01
Series:PLoS ONE
Online Access:http://europepmc.org/articles/PMC5828438?pdf=render

Internet

http://europepmc.org/articles/PMC5828438?pdf=render

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