Scanning frequency comb microscopy—A new method in scanning probe microscopy
A method for superimposing a microwave frequency comb (MFC) on the DC tunneling current in a scanning tunneling microscope (STM) is described in which a mode-locked laser is focused on the tunneling junction. The MFC is caused by optical rectification of the regular sequence of laser pulses due to t...
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2018-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5047440 |