Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
Abstract Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron ba...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2017-09-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-017-11187-z |