Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
The paper presents a two-color digital holographic interferometer. The set-up is devoted to the investigation of crack origin in hybrid industrial electronic components. Optical configuration and algorithms to recover the optical phase of two-color digitally encoded holograms are described. The m...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2010-06-01
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| Series: | EPJ Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/epjconf/20100630003 |