Investigation of crack origin in hybrid components with twocolor digital Fresnel holography

Investigation of crack origin in hybrid components with twocolor digital Fresnel holography

The paper presents a two-color digital holographic interferometer. The set-up is devoted to the investigation of crack origin in hybrid industrial electronic components. Optical configuration and algorithms to recover the optical phase of two-color digitally encoded holograms are described. The m...

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Main Authors: Moisson E., Mounier D., Tankam P., Picart P.
Format: Article
Language:English
Published: EDP Sciences 2010-06-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/20100630003
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spelling doaj-7b454b5d70ae424c81ec63cc115828bc2021-08-02T04:01:28ZengEDP SciencesEPJ Web of Conferences2100-014X2010-06-0163000310.1051/epjconf/20100630003Investigation of crack origin in hybrid components with twocolor digital Fresnel holographyMoisson E.Mounier D.Tankam P.Picart P.The paper presents a two-color digital holographic interferometer. The set-up is devoted to the investigation of crack origin in hybrid industrial electronic components. Optical configuration and algorithms to recover the optical phase of two-color digitally encoded holograms are described. The method is based on a spatial-color-multiplexing scheme in which holographic reconstruction is performed using a spectral scanning algorithm. Experimental results exhibit in-plane and out-of-plane non uniform deformations that are the probable cause of the cracking of the component. http://dx.doi.org/10.1051/epjconf/20100630003
collection DOAJ
language English
format Article
sources DOAJ
author Moisson E.
Mounier D.
Tankam P.
Picart P.
spellingShingle Moisson E.
Mounier D.
Tankam P.
Picart P.
Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
EPJ Web of Conferences
author_facet Moisson E.
Mounier D.
Tankam P.
Picart P.
author_sort Moisson E.
title Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
title_short Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
title_full Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
title_fullStr Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
title_full_unstemmed Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
title_sort investigation of crack origin in hybrid components with twocolor digital fresnel holography
publisher EDP Sciences
series EPJ Web of Conferences
issn 2100-014X
publishDate 2010-06-01
description The paper presents a two-color digital holographic interferometer. The set-up is devoted to the investigation of crack origin in hybrid industrial electronic components. Optical configuration and algorithms to recover the optical phase of two-color digitally encoded holograms are described. The method is based on a spatial-color-multiplexing scheme in which holographic reconstruction is performed using a spectral scanning algorithm. Experimental results exhibit in-plane and out-of-plane non uniform deformations that are the probable cause of the cracking of the component.
url http://dx.doi.org/10.1051/epjconf/20100630003
work_keys_str_mv AT moissone investigationofcrackorigininhybridcomponentswithtwocolordigitalfresnelholography
AT mounierd investigationofcrackorigininhybridcomponentswithtwocolordigitalfresnelholography
AT tankamp investigationofcrackorigininhybridcomponentswithtwocolordigitalfresnelholography
AT picartp investigationofcrackorigininhybridcomponentswithtwocolordigitalfresnelholography
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