Free Form Deformation-Based Image Registration Improves Accuracy of Traction Force Microscopy.

Free Form Deformation-Based Image Registration Improves Accuracy of Traction Force Microscopy.

Traction Force Microscopy (TFM) is a widespread method used to recover cellular tractions from the deformation that they cause in their surrounding substrate. Particle Image Velocimetry (PIV) is commonly used to quantify the substrate's deformations, due to its simplicity and efficiency. Howeve...

Full description

Bibliographic Details
Main Authors: Alvaro Jorge-Peñas, Alicia Izquierdo-Alvarez, Rocio Aguilar-Cuenca, Miguel Vicente-Manzanares, José Manuel Garcia-Aznar, Hans Van Oosterwyck, Elena M de-Juan-Pardo, Carlos Ortiz-de-Solorzano, Arrate Muñoz-Barrutia
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2015-01-01
Series:PLoS ONE
Online Access:http://europepmc.org/articles/PMC4671587?pdf=render

Internet

http://europepmc.org/articles/PMC4671587?pdf=render

Similar Items