Use of Hyperspectral Imaging for the Quantification of Organic Contaminants on Copper Surfaces for Electronic Applications

Use of Hyperspectral Imaging for the Quantification of Organic Contaminants on Copper Surfaces for Electronic Applications

To correctly assess the cleanliness of technical surfaces in a production process, corresponding online monitoring systems must provide sufficient data. A promising method for fast, large-area, and non-contact monitoring is hyperspectral imaging (HSI), which was used in this paper for the detection...

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Bibliographic Details
Main Authors: Tim Englert, Florian Gruber, Jan Stiedl, Simon Green, Timo Jacob, Karsten Rebner, Wulf Grählert
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Sensors
Subjects:
spectral imaging
HSI
XPS
AES
multivariate analysis
machine learning
Online Access:https://www.mdpi.com/1424-8220/21/16/5595

Internet

https://www.mdpi.com/1424-8220/21/16/5595

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