Observation of strontium segregation in LaAlO3/SrTiO3 and NdGaO3/SrTiO3 oxide heterostructures by X-ray photoemission spectroscopy

LaAlO3 and NdGaO3 thin films of different thicknesses have been grown by pulsed laser deposition on TiO2-terminated SrTiO3 single crystals and investigated by soft X-ray photoemission spectroscopy. The surface sensitivity of the measurements has been tuned by varying photon energy hν and emission an...

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Bibliographic Details
Main Authors: Uwe Treske, Nadine Heming, Martin Knupfer, Bernd Büchner, Andreas Koitzsch, Emiliano Di Gennaro, Umberto Scotti di Uccio, Fabio Miletto Granozio, Stefan Krause
Format: Article
Language:English
Published: AIP Publishing LLC 2014-01-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.4861797