Coupling effect in field Hall elements based on thin-film SOI MOS transistors

The influence of the coupling effect on the parameters of field Hall elements based on thin-film MOS transistors has been studied. Analysis of the development of today’s microelectronics shows the necessity of developing the element base for high performance sensors based on silicon...

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Bibliographic Details
Main Authors: Aleksey V. Leonov, Victor N. Murashev, Dmitry N. Ivanov, V.D. Kirilov
Format: Article
Language:English
Published: Pensoft Publishers 2020-12-01
Series:Modern Electronic Materials
Online Access:https://moem.pensoft.net/article/65567/download/pdf/