Electron Tomography of Pencil-Shaped GaN/(In,Ga)N Core-Shell Nanowires

Electron Tomography of Pencil-Shaped GaN/(In,Ga)N Core-Shell Nanowires

Abstract The three-dimensional structure of GaN/(In,Ga)N core-shell nanowires with multi-faceted pencil-shaped apex is analyzed by electron tomography using high-angle annular dark-field mode in a scanning transmission electron microscope. Selective area growth on GaN-on-sapphire templates using a p...

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Bibliographic Details
Main Authors: Lars Nicolai, Žarko Gačević, Enrique Calleja, Achim Trampert
Format: Article
Language:English
Published: SpringerOpen 2019-07-01
Series:Nanoscale Research Letters
Subjects:
Electron tomography
STEM
(In,Ga)N/GaN nanowire
Dot-in-a-wire
Morphology
Online Access:http://link.springer.com/article/10.1186/s11671-019-3072-1

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http://link.springer.com/article/10.1186/s11671-019-3072-1

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