An Ionizing Radiation Sensor Using a Pre-Programmed MAHAOS Device

Metal-aluminum oxide–hafnium aluminum oxide‒silicon oxide–silicon (hereafter MAHAOS) devices can be candidates for ionizing radiation sensor applications. In this work, MAHAOS devices (SONOS-like structures with high k stack gate dielectric) were studied regarding the first known characterization of...

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Bibliographic Details
Main Authors: Wen-Ching Hsieh, Hao-Tien Daniel Lee, Fuh-Cheng Jong
Format: Article
Language:English
Published: MDPI AG 2014-08-01
Series:Sensors
Subjects:
MOS
Online Access:http://www.mdpi.com/1424-8220/14/8/14553