Dual-comb spectroscopic ellipsometry

Spectroscopic ellipsometry is an established technique to characterize the optical properties of a material. Here, Minamikawa et al. combine the method with dual-comb spectroscopy, which allows them to obtain ellipsometric parameters including the phase difference between s-polarized and p-polarized...

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Bibliographic Details
Main Authors: Takeo Minamikawa, Yi-Da Hsieh, Kyuki Shibuya, Eiji Hase, Yoshiki Kaneoka, Sho Okubo, Hajime Inaba, Yasuhiro Mizutani, Hirotsugu Yamamoto, Tetsuo Iwata, Takeshi Yasui
Format: Article
Language:English
Published: Nature Publishing Group 2017-09-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-017-00709-y