On the Limits of Scanning Thermal Microscopy of Ultrathin Films

On the Limits of Scanning Thermal Microscopy of Ultrathin Films

Heat transfer processes in micro- and nanoscale devices have become more and more important during the last decades. Scanning thermal microscopy (SThM) is an atomic force microscopy (AFM) based method for analyzing local thermal conductivities of layers with thicknesses in the range of several nm to...

Full description

Bibliographic Details
Main Authors: Christoph Metzke, Werner Frammelsberger, Jonas Weber, Fabian Kühnel, Kaichen Zhu, Mario Lanza, Günther Benstetter
Format: Article
Language:English
Published: MDPI AG 2020-01-01
Series:Materials
Subjects:
scanning thermal microscopy
sthm
atomic force microscopy
afm
boron nitride
h-bn
topography influences
ultrathin films
copper iodide
cui
Online Access:https://www.mdpi.com/1996-1944/13/3/518

Internet

https://www.mdpi.com/1996-1944/13/3/518

Similar Items