Data processing approaches in adopting single point–like emitter spectromicroscopy for mapping material characteristics of solid media
We report an algorithm for building topogram of dielectric properties of a thin film by data of spectromicroscopy of single emitters.
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| Format: | Article |
| Language: | English |
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EDP Sciences
2017-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://doi.org/10.1051/epjconf/201716103003 |