A Novel Monitoring Strategy Combining the Advantages of NPE and GMM
Semiconductor manufacturing process data usually have multimodel and multiphase characteristics which do not meet the application assumptions in neighborhood preserving embedding (NPE). Aiming at the above limitations of NPE, a novel monitoring strategy combining the advantages of the neighborhood p...
Main Authors: | , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
|
Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9078081/ |