Winter Wheat Yield Assessment from Landsat 8 and Sentinel-2 Data: Incorporating Surface Reflectance, Through Phenological Fitting, into Regression Yield Models

Winter Wheat Yield Assessment from Landsat 8 and Sentinel-2 Data: Incorporating Surface Reflectance, Through Phenological Fitting, into Regression Yield Models

A combination of Landsat 8 and Sentinel-2 offers a high frequency of observations (3−5 days) at moderate spatial resolution (10−30 m), which is essential for crop yield studies. Existing methods traditionally apply vegetation indices (VIs) that incorporate surface reflectances (S...

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Bibliographic Details
Main Authors: Sergii Skakun, Eric Vermote, Belen Franch, Jean-Claude Roger, Nataliia Kussul, Junchang Ju, Jeffrey Masek
Format: Article
Language:English
Published: MDPI AG 2019-07-01
Series:Remote Sensing
Subjects:
agriculture
crop yield
wheat
Landsat 8
Sentinel-2
HLS
phenological fitting
growing degree days (GDD)
Online Access:https://www.mdpi.com/2072-4292/11/15/1768

Internet

https://www.mdpi.com/2072-4292/11/15/1768

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