Effect of Eigenmode Frequency on Loss Tangent Atomic Force Microscopy Measurements
Atomic Force Microscopy (AFM) is no longer used as a nanotechnology tool responsible for topography imaging. However, it is widely used in different fields to measure various types of material properties, such as mechanical, electrical, magnetic, or chemical properties. One of the recently developed...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-07-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/11/15/6813 |