Measuring Nanoscale Distances by Structured Illumination Microscopy and Image Cross-Correlation Spectroscopy (SIM-ICCS)

Since the introduction of super-resolution microscopy, there has been growing interest in quantifying the nanoscale spatial distributions of fluorescent probes to better understand cellular processes and their interactions. One way to check if distributions are correlated or not is to perform coloca...

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Bibliographic Details
Main Authors: Isotta Cainero, Elena Cerutti, Mario Faretta, Gaetano Ivan Dellino, Pier Giuseppe Pelicci, Alberto Diaspro, Luca Lanzanò
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Sensors
Subjects:
SIM
Online Access:https://www.mdpi.com/1424-8220/21/6/2010