Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope
Imaging and evaporation of atoms in the field ion microscope (FIM) has been modelled by using finite difference methods to calculate the voltage distribution around a tip and hence the electric field strength experienced by individual atoms. Atoms are evaporated based on field strength using a numbe...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2012-01-01
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| Series: | Journal of Sensors |
| Online Access: | http://dx.doi.org/10.1155/2012/961239 |