Vacuum chamber considerations for improved organic light-emitting diode lifetime

We investigated the influence of vacuum chamber impurities on the lifetime of highly efficient TADF-based OLEDs. Batch-to-batch lifetime variations are clearly correlated with the results of contact angle measurements, which reflect the amount of impurities present in the chamber. Introduction of oz...

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Bibliographic Details
Main Authors: Hiroshi Fujimoto, Shin-ichiro Kobayashi, Hin Wai Mo, Satoshi Yukiwaki, Kaori Nagayoshi, Mao Yasumatsu, Kentaro Harada, Chihaya Adachi
Format: Article
Language:English
Published: AIP Publishing LLC 2018-08-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5047542