Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

We report measurements of the transient structural response of weakly photo-excited thin films of BiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with time resolution e...

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Bibliographic Details
Main Authors: M. Kozina, T. Hu, J. S. Wittenberg, E. Szilagyi, M. Trigo, T. A. Miller, C. Uher, A. Damodaran, L. Martin, A. Mehta, J. Corbett, J. Safranek, D. A. Reis, A. M. Lindenberg
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2014-05-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/1.4875347

Internet

http://dx.doi.org/10.1063/1.4875347

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