Accumulator based BIST using Approximate Adders
In this paper, we present an accumulator based built-in self test (BIST) with approximate adders for single input change (SIC) test pattern generation. The SIC pairs of test pattern is the key requirement for testing robustly detectable delay faults. The accumulator is designed using approximate ad...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Editura Universităţii din Oradea
2019-05-01
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| Series: | Journal of Electrical and Electronics Engineering |
| Subjects: | |
| Online Access: | https://electroinf.uoradea.ro/images/articles/CERCETARE/Reviste/JEEE/JEEE_V12_N1_MAY_2019/04%20paper%200412%20KARUNAMURTHY.pdf |